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Volumn 190, Issue 1-4, 2002, Pages 79-83

Random stopping power and energy straggling of 16O ions into amorphous Si target

Author keywords

Energy loss; Energy straggling; Oxygen; RBS; Silicon; Stopping power

Indexed keywords

AMORPHOUS SILICON; ENERGY DISSIPATION; ION IMPLANTATION; MONTE CARLO METHODS; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 0036570027     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01174-0     Document Type: Conference Paper
Times cited : (11)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.