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Volumn 190, Issue 1-4, 2002, Pages 79-83
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Random stopping power and energy straggling of 16O ions into amorphous Si target
a a a a |
Author keywords
Energy loss; Energy straggling; Oxygen; RBS; Silicon; Stopping power
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Indexed keywords
AMORPHOUS SILICON;
ENERGY DISSIPATION;
ION IMPLANTATION;
MONTE CARLO METHODS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
STOPPING POWER;
OXYGEN;
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EID: 0036570027
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(01)01174-0 Document Type: Conference Paper |
Times cited : (11)
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References (9)
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