SCOPUS 정보 검색 플랫폼

Journal of Non-Crystalline Solids

Volumn 303, Issue 1, 2002, Pages 185-189

Electrical characterisation of SrTiO3/Si interfaces

(5) Konofaos, N a Evangelou, E K a Wang, Zhongchun b Kugler, V b Helmersson, U b

a UNIVERSITY OF IOANNINA (Greece)

b LINKÖPING UNIVERSITY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; PERMITTIVITY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SPECTROSCOPIC ANALYSIS; THIN FILMS; ULTRAHIGH VACUUM; X RAY DIFFRACTION ANALYSIS;

ADMITTANCE SPECTROSCOPY;

STRONTIUM COMPOUNDS;

EID: 0036567725 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(02)00983-3 Document Type: Article

Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.