Real-time single-shot electron bunch length measurements

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 483, Issue 1-2, 2002, Pages 282-285

  Wilke, I ^a   MacLeod, A M ^b   Gillespie, W A ^b   Berden, G ^c   Knippels, G M H ^c   Van Der Meer, A F G ^c  

^a UNIVERSITY OF HAMBURG   (Germany)

^b UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

^c FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

Free electron laser

Indexed keywords

BIREFRINGENCE; CAMERAS; CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; ELECTROOPTICAL EFFECTS; LASER PULSES; PARTICLE ACCELERATORS; PARTICLE BEAM BUNCHING;

NON-RADIATIVE ELECTRIC FIELDS;

FREE ELECTRON LASERS;

EID: 0036566932     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)00328-5     Document Type: Conference Paper

References (10)