Phonon dispersion studies of crystalline materials using high-energy resolution inelastic X-ray scattering (IXS)

Physica B: Condensed Matter

Volumn 316-317, Issue , 2002, Pages 150-153

  D'Astuto, M ^a   Giura, P ^a   Krisch, M ^a   Lorenzen, M ^a   Mermet, A ^a   Monaco, G ^a   Requardt, H ^a   Sette, F ^a   Shukla, A ^a   Verbeni, R ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Crystals; High pressure; Inelastic X ray scattering

Indexed keywords

DISPERSIONS; HIGH ENERGY PHYSICS; NEUTRON SCATTERING; PHONONS; RAMAN SCATTERING; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

INELASTIC X-RAY SCATTERING (IXS); PHONON DISPERSION;

POLYCRYSTALLINE MATERIALS;

EID: 0036566926     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(02)00445-3     Document Type: Conference Paper

References (21)