SPIX: A new technique for quantitative surface spectroscopy applied to S/InP(001)

Applied Surface Science

Volumn 103, Issue 3, 1996, Pages 289-298

  Rodriguez Fernandez L ^a,b   Lennard, W N ^a   Xia, H ^a   Massoumi, G R ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; SEMICONDUCTING INDIUM PHOSPHIDE; SULFUR;

CHARGED PARTICLE X RAY EXCITATION; SURFACE SENSITIVE PARTICLE INDUCED X RAY ANALYSIS (SPIX);

X RAY SPECTROSCOPY;

EID: 0030286488     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00528-4     Document Type: Article

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