Single event upset studies with the optical links of the ATLAS semiconductor tracker

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 481, Issue 1-3, 2002, Pages 575-584

  Dowell, J D ^a   Homer, R J ^a   Mahout, G ^a   Jovanovic, P ^a   Gregor, I M ^b   Wastie, R L ^c   Weidberg, A R ^c   Troska, J K ^d   White, D J ^d  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b UNIVERSITY OF WUPPERTAL   (Germany)

^c UNIVERSITY OF OXFORD   (United Kingdom)

^d RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

ASICs; Data transmission; LHC; Optoelectronics; Photodiode; Radiation tolerance; Single event upset

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COLLIDING BEAM ACCELERATORS; DATA COMMUNICATION SYSTEMS; FIBER OPTICS; NEUTRONS; PHOTODIODES; PROTON BEAMS; SEMICONDUCTOR MATERIALS;

OPTICAL LINKS;

OPTOELECTRONIC DEVICES;

EID: 0036534282     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01411-5     Document Type: Article

References (19)

1. Radiation tests of optical link components for the ATLAS SCT
2. SEU tests of an 80 Mbit/s optical receiver