Determination of bulk and surface transport properties by photocurrent spectral measurements

Applied Physics A: Materials Science and Processing

Volumn 71, Issue 3, 2000, Pages 305-310

  Castaldini, A ^a   Cavalcoli, D ^a   Cavallini, A ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DIFFUSION IN SOLIDS; PHOTOCURRENTS; RAPID THERMAL ANNEALING; SCHOTTKY BARRIER DIODES; SILICON WAFERS; SURFACE TREATMENT;

PHOTOCURRENT SPECTRAL MEASUREMENT; SURFACE PHOTOVOLTAGE METHOD; SURFACE RECOMBINATION VELOCITY;

TRANSPORT PROPERTIES;

EID: 0034275321     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390000528     Document Type: Article

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