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Volumn 60, Issue 3-4, 2002, Pages 381-393
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Charge sheet model of a polysilicon thin-film transistor
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Author keywords
Charge sheet approach; Grain size; Poly Si; Thin film transistor
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
DIFFUSION;
ELECTRIC CONDUCTANCE;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
POLYSILICON;
SEMICONDUCTOR DOPING;
CHARGE SHEET;
THIN FILM TRANSISTORS;
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EID: 0036532412
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(01)00697-9 Document Type: Article |
Times cited : (16)
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References (17)
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