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Volumn 149, Issue 4, 2002, Pages
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Mass spectrometric study of oxidation of SiC in low-pressure oxygen
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON MONOXIDE;
CHEMICAL VAPOR DEPOSITION;
COATINGS;
CRYSTAL STRUCTURE;
HIGH TEMPERATURE EFFECTS;
MASS SPECTROMETRY;
OXIDATION;
OXYGEN;
PARTIAL PRESSURE;
REACTION KINETICS;
SILICON CARBIDE;
X RAY CRYSTALLOGRAPHY;
ION CURRENT;
PASSIVE TO ACTIVE OXIDATION TRANSITION;
XENON IMAGE FURNACE;
ELECTROCHEMISTRY;
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EID: 0036530386
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1457991 Document Type: Article |
Times cited : (22)
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References (18)
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