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Volumn 41, Issue 4, 2002, Pages 2171-2175

Electronic structures and etching processes of chlorinated Si(111) surfaces

Author keywords

Activa tion energy; Chlorine; Collision; Dichloride; Etching; Evaporation; Monochloride; Si(111) surface; Trichloride

Indexed keywords

ACTIVATION ENERGY; CHLORINATION; COMPUTER AIDED SOFTWARE ENGINEERING; DESORPTION; ELECTRONIC STRUCTURE; ETCHING; EVAPORATION; PROBABILITY DENSITY FUNCTION; SURFACE TREATMENT;

EID: 0036529347     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.2171     Document Type: Article
Times cited : (25)

References (33)
  • 24
    • 0005895394 scopus 로고
    • computer program package TAPP, University of Tokyo, Tokyo, Japan
    • (1983)
    • Tsukada, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.