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Volumn 53, Issue 1-2, 2002, Pages 68-75
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Hexagonal GaN films deposited by reactive hot wall evaporation technique
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Author keywords
Conductivity; Direct band gap; Gallium nitride; Microstructure; Photoluminescence; Semiconductors
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Indexed keywords
ABSORPTION SPECTROSCOPY;
MICROSTRUCTURE;
PHOTOLUMINESCENCE;
REFRACTIVE INDEX;
SURFACE ROUGHNESS;
THIN FILMS;
REACTIVE HOT WALL EVAPORATION;
GALLIUM NITRIDE;
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EID: 0036497882
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-577X(01)00455-4 Document Type: Article |
Times cited : (10)
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References (19)
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