Automated test pattern generation for analog integrated circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 296-301

  Verhaegen, Wim ^a   Van der Plas, Geert ^a   Gielen, Georges ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED NETWORK ANALYSIS; STATISTICAL TESTS;

ANALOG INTEGRATED CIRCUITS; AUTOMATED TEST PATTERN GENERATION (ATPG);

INTEGRATED CIRCUIT TESTING;

EID: 0030709160     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)