SCOPUS 정보 검색 플랫폼

Surface and Coatings Technology

Volumn 150, Issue 1, 2002, Pages 76-79

Cryogenic processing of thin metal films

(2) He, L a Siewenie, J E b

a SAN JOSE STATE UNIVERSITY (United States)

b NORTHERN ILLINOIS UNIVERSITY (United States)

Author keywords

Cryogenic processing; Metal semiconductor metal (MSM) photodetectors

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYOGENICS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONTACTS; INTEGRATED OPTOELECTRONICS; LOW TEMPERATURE EFFECTS; PHOTODETECTORS; SCHOTTKY BARRIER DIODES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

METAL-SEMICONDUCTOR-METAL (MSM) PHOTODETECTORS;

METALLIC FILMS;

FILM;

EID: 0036470331 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/S0257-8972(01)01504-3 Document Type: Article

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.