Thickness-dependent structural characteristics of sol-gel-derived epitaxial (PbZr)TiO3 films using inorganic zirconium salt

Journal of Crystal Growth

Volumn 235, Issue 1-4, 2002, Pages 307-312

  Li, A D ^a,b   Mak, C L ^b   Wong, K H ^b   Shao, Q Y ^a   Wang, Y J ^a   Wu, D ^a   Ming, Naiben ^a  

^a NANJING UNIVERSITY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

A1. Thickness; A1. X ray diffraction; A3. Epitaxy; A3. Sol gel method; B1. Perovskites; B1. Titanium compounds

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC THIN FILMS; PEROVSKITE; RAPID THERMAL ANNEALING; SALTS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; SOL-GELS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL FILMS;

EPITAXIAL GROWTH;

EID: 0036467099     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01805-X     Document Type: Article

References (15)