Microscopic ultraviolet photoelectron spectroscopy using He-I and He-II resonance lines

Surface Review and Letters

Volumn 9, Issue 1, 2002, Pages 521-527

  Kondo, Yuzi ^a   Ejima, Takeo ^a   Takatsuka, Hirofumi ^a   Watanabe, Makoto ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM;

CONFERENCE PAPER; CONTRAST ENHANCEMENT; CRYSTAL STRUCTURE; IMAGE ANALYSIS; IRRADIATION; MATERIAL COATING; SAMPLING; SYNCHROTRON; TECHNIQUE; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036463033     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X02002580     Document Type: Conference Paper

References (16)