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Volumn , Issue , 2002, Pages 176-178

Impact of technology parameters on inverter delay of UTB-SOI CMOS

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC INVERTERS; MOSFET DEVICES; PARAMETER ESTIMATION; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SILICON ON INSULATOR TECHNOLOGY;

EID: 0036458634     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/soi.2002.1044466     Document Type: Conference Paper
Times cited : (10)

References (4)
  • 1
    • 0033750493 scopus 로고    scopus 로고
    • Ultrathin-Body SOI MOSFET for Deep-Sub-Tenth Micron Era
    • May
    • Y.-K. Choi, et al., "Ultrathin-Body SOI MOSFET for Deep-Sub-Tenth Micron Era", IEEE Electron Device Letters, May 2000, pp. 254-255.
    • (2000) IEEE Electron Device Letters , pp. 254-255
    • Choi, Y.-K.1
  • 2
    • 0004022746 scopus 로고    scopus 로고
    • Santa Clara, Oct.
    • Silvaco Intern., Atlas User's Manual, Santa Clara, Oct. 1996.
    • (1996) Atlas User's Manual
  • 3
    • 0036160670 scopus 로고    scopus 로고
    • An Adjustable Work Function Using Mo Gate for CMOS Devices
    • January
    • R. Lin, et al., "An Adjustable Work Function Using Mo Gate for CMOS Devices", IEEE Electron Device Letters, January 2002, pp. 49-51.
    • (2002) IEEE Electron Device Letters , pp. 49-51
    • Lin, R.1
  • 4
    • 0035714288 scopus 로고    scopus 로고
    • Properties of Ru-Ta Alloys as Gate Electrodes For NMOS and PMOS Silicon Devices
    • Dec.
    • H. Zhong, et al., "Properties of Ru-Ta Alloys as Gate Electrodes For NMOS and PMOS Silicon Devices", IEDM Tech. Dig., Dec. 2001, pp. 467-470.
    • (2001) IEDM Tech. Dig. , pp. 467-470
    • Zhong, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.