Detection of substitutional and interstitial Fe in silicon by Mössbauer spectrocopy

Physica Scripta T

Volumn 101, Issue , 2002, Pages 82-85

  Gunnlaugsson, H P ^a   Dietrich, M ^b   Fanciulli, M ^c   Bharuth Ram, K ^d   Sielemann, R ^e   Weyer, G ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b CERN   (Switzerland)

^c LABORATORIO MDM   (Italy)

^d UNIVERSITY OF KWAZULU NATAL   (South Africa)

^e HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALS; DIFFUSION; IRON; LATTICE CONSTANTS; MOSSBAUER SPECTROSCOPY; SEMICONDUCTING SILICON;

RECOIL ENERGY;

CRYSTAL IMPURITIES;

EID: 0036447172     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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