GHz testing and its fuzzy targets

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1228-

  Hawkins, C ^a   Segura, J ^b  

^a UNIVERSITY OF NEW MEXICO   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT; DELAY FAULT TEST METHODS; GIGAHERTZ INTEGRATED CIRCUITS; GIGAHERTZ TESTING; KEITHLEY INSTRUMENT TEST STRUCTURE;

ELECTRIC FREQUENCY MEASUREMENT; ELECTRIC POWER MEASUREMENT; ELECTRIC POWER SUPPLIES TO APPARATUS; FAILURE ANALYSIS; FUZZY SETS; GEOMETRY; PARAMETER ESTIMATION; STATISTICAL METHODS; TRANSIENTS;

INTEGRATED CIRCUIT TESTING;

EID: 0036446492     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2002.1041929     Document Type: Conference Paper

References (5)

1. T. Turner, Keithley Instruments Corp., Reliability Lectures at the University of New Mexico, Feb. 2000.
2. K. Bernstein, et al., High Speed CMOS Design Styles, Kluwer Academic Publishers, 1998.
3. J. Segura, A. Keshavarzi, J. Soden, and C. Hawkins, "Parametric Failures in CMOS ICs - A Defect-Based Analysis," IEEE Int. Test Conf. (ITC), Oct. 2002.
4. S. Vangal. et al., "A 2.5 GHz 23b Integer-Execution Core in 130 nm Dual-Vt CMOS," IEEE Int. Solid-State Circuits Conf., pp. 412-413, Feb. 2002.
5. DDQ," IEEE Int. Test Conf. (ITC), pp. 1051-1059, Oct. 2000.