WinX-Ray: A new Monte Carlo program for the simulation of X-ray and charging materials

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 1498-1499

  Demers, Hendrix ^a   Horny, Paula ^a   Gauvin, Raynald ^a   Lifshin, Eric ^b  

^a MCGILL UNIVERSITY   (Canada)

^b STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036414512     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602104120     Document Type: Conference Paper

References (4)

1. P. Hovington, D. Drouin and R. Gauvin, CASlNO: A new Monte Carlo code in C language for the electron beam interactions - Part I: Description of the Program, SCANNING, 19, 1-14 (1997).
2. H. Demers, Les effets de charge pour un échantillon isolant dans un microscope électronique à balayage, Master's Thesis, University of Sherbrooke (2002).
3. H. Demers and R. Gauvin, X-ray Microanalysis of a Coated Non-Conductive Specimen: Monte Carlo Simulation, Microscopy & Microanalysis, in this volume (2002).
4. J. Cazaux, Electron Probe Microanalysis of Non-Conductive Materials: Quantification Problems and some Possible Solutions, X-Ray Spectrometry. 25, 265 (1996).