X-ray microanalysis of a coated non-conductive specimen: Monte Carlo simulation

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 1462-1463

  Demers, Hendrix ^a   Gauvin, Raynald ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036411923     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602103941     Document Type: Conference Paper

References (5)

1. H. Demers et al., WinX-Ray: A New Monte Carlo Program for the Simulation of X-Ray and Charging Materials, Microscopy & Microanalysis, in this volume (2002).
2. J. Cazaux, Electron Probe Microanalysis of Insulating Materials: Quantification Problems and some Possible Solutions, X-Ray Spectrometry. 25, 265 (1996).
3. R. Gauvin et al., Modeling contrast in VPSEM, Microscopy & Microanalysis, in this volume (2002).
4. S. Odof, Microanalyse X des isolants: simulation de Monte-Carlo, 2000, Ph.D. Thesis, University of Reims Champagne-Ardenne.
5. L. Sorbier, Apport de la simulation dans l'optimisation de l'analyse quantitative par microsonde électronique de catalyseurs hétérogènes, 2001, Ph.D. Thesis, Université de Montpellier II.