Benefits and possibilities of Cc-correction for TEM/STEM

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 12-13

  Müller, Heiko ^a   Uhlemann, Stephan ^a   Haider, Maximilian ^a  

^a CEOS GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036412128     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602101498     Document Type: Conference Paper

References (7)

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3. J. Zach and M. Haider, Nucl. Instr. Meth. A363 (1995) 316.
4. P. Hartel et al., Proc. EUREM Brno/Cz, Vol.III (2000) 1459.
5. F. Kahl, Proc. Microsc. Microanal. 7, Suppl. 2 (2001) 922.
6. C. Weißbäcker and H. Rose, J. Elecrton Microsc. 50(5) (2001) 383.
7. H. Rose, private communication.