Local optical characteristics of semiconductor surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4607, Issue , 2002, Pages 168-177

  Tománek, Pavel ^a   Benešová, Markéta ^a   Košt'álová, Dana ^a   Létal, Petr ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Local current spectroscopy; Local photoluminescence; Local photoreflectance; Resolution; Scanning near field optical microscopy

Indexed keywords

MOLECULAR BEAM EPITAXY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHOTOCURRENTS; PHOTOLUMINESCENCE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR QUANTUM WELLS;

PHOTOELECTRONS; PHOTOREFLECTANCE (PR);

OPTICAL CORRELATION;

EID: 0036398731     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.455186     Document Type: Conference Paper

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