High-resolution transmission electron microscopy of phase formation and growth in metal-Si-Ge systems

Micron

Volumn 33, Issue 6, 2002, Pages 535-541

  Chen, L J ^a   Lai, J B ^a   Lee, C S ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Interfacial reactions; Metal; Si Ge

Indexed keywords

ARTICLE;

EID: 0036392463     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(02)00008-2     Document Type: Article

References (23)

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