PATISSIER: Software to estimate the smectite content and number of consecutive illite layers in mixed-layer illite-smectite using illite crystallinity data

Schweizerische Mineralogische und Petrographische Mitteilungen

Volumn 82, Issue 2, 2002, Pages 221-228

  Jaboyedoff, Michel ^a   Thélin, Philippe ^a  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

Author keywords

Illite crystallinity; Illite smectite; Mixed layer; Software; XRD

Indexed keywords

CRYSTALLINITY; DIAGENESIS; ILLITE; LOW GRADE METAMORPHISM; SMECTITE; SOFTWARE;

EID: 0036374739     PISSN: 00367699     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (38)

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