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Volumn 693, Issue , 2002, Pages 309-314

Superior structural quality of newly developed GaN pendeo-epitaxial layers

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; ETCHING; NUCLEATION; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036374057     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.