EFSIM: an integrated circuit early failure simulator

Quality and Reliability Engineering International

Volumn 12, Issue 4, 1996, Pages 229-234

  Moosa, Mohamed S ^a   Poole, Kelvin F ^a   Grams, Michael L ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; DEFECTS; FAILURE ANALYSIS; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; MONITORING; MONTE CARLO METHODS; RELIABILITY; SIMULATORS;

GATE OXIDE RELIABILITY; INTEGRATED CIRCUIT EARLY FAILURE SIMULATOR; INTEGRATED CIRCUIT RELIABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0030197833     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199607)12:4<229::AID-QRE38>3.0.CO;2-9     Document Type: Article

References (26)