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Volumn 686, Issue , 2002, Pages 59-68
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Integration challenges for double-gate MOSFET technologies
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Author keywords
[No Author keywords available]
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Indexed keywords
BONDING;
ELECTRON TUNNELING;
EPITAXIAL GROWTH;
ETCHING;
GATES (TRANSISTOR);
WAFER BONDING;
MOSFET DEVICES;
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EID: 0036346964
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (31)
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