메뉴 건너뛰기




Volumn 686, Issue , 2002, Pages 59-68

Integration challenges for double-gate MOSFET technologies

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; ELECTRON TUNNELING; EPITAXIAL GROWTH; ETCHING; GATES (TRANSISTOR);

EID: 0036346964     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.