Low frequency noise characterization and modeling of microwave bipolar devices: Application to the design of low phase noise oscillator

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers

Volumn , Issue , 2002, Pages 359-362

  Bary, Laurent ^a   Cibiel, Gilles ^a   Telliez, Isabelle ^a   Rayssac, Jacques ^a   Rennane, Abdel ^a   Boulanger, Cyrille ^a   Llopis, Olivier ^a   Borgarino, Mattia ^a   Plana, Robert ^a   Graffeuil, Jacques ^a  

^a LAAS CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTION BIPOLAR TRANSISTORS; NEGATIVE RESISTANCE; QUALITY OF SERVICE; SEMICONDUCTING SILICON COMPOUNDS; SPURIOUS SIGNAL NOISE; WIRELESS TELECOMMUNICATION SYSTEMS;

LOW FREQUENCY (LF) NOISE; PHASE NOISE OSCILLATORS;

MICROWAVE OSCILLATORS;

EID: 0036317263     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. BiCMOS6G: A high performance 0.35 μm SiGe BiCMOS technology for wireless applications
2. Transimpedance amplifier based full low noise characterization set-up for Si/SiGe HBT's
3. The correlation resistance for low frequency noise compact modeling of Si/SiGe HBT's
4. Non-linear modeling and design of bipolar transistors ultra low phase noise dielectric resonator oscillator
5. Phase noise measurements using cross-spectrum analysis
6. Design considerations in state-of-the-art signal processing and phase noise measurement systems
7. Evaluation of two non-standard techniques for the phase noise characterization at microwave frequencies
8. General noise analysis of nonlinear microwave circuits by the piecewiese harmonic-balance technique