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Ultramicroscopy

Volumn 92, Issue 3-4, 2002, Pages 201-207

A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biology

(5) Wu, Aiguo a Li, Zhuang a Yu, Lihua a Wang, Hongda a Wang, Erkang a

a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY (China)

Author keywords

AFM; DNA; Sample locator system; Tapping mode and contact mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; DNA; SUBSTRATES;

SAMPLE LOCATOR SYSTEM;

MOLECULAR BIOLOGY;

DNA; PLASMID DNA;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; IMAGE PROCESSING; MOLECULAR BIOLOGY; SAMPLE; TECHNIQUE;

ALUMINUM SILICATES; DNA; MICROSCOPY, ATOMIC FORCE; MOLECULAR BIOLOGY; PLASMIDS;

EID: 0036306981 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(02)00133-X Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.