Determination of thickness, refractive index, and thickness irregularity for semiconductor thin films from transmission spectra

Applied Optics

Volumn 41, Issue 1, 2002, Pages 218-224

  Aqili, Akram K S ^a   Maqsood, Asghari ^a  

^a QUAID I AZAM UNIVERSITY   (Pakistan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; LIGHT EXTINCTION; LIGHT TRANSMISSION; REFRACTIVE INDEX; SUBSTRATES; THIN FILMS;

SEMICONDUCTOR THIN FILMS;

SEMICONDUCTING FILMS;

EID: 0036279524     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.000218     Document Type: Article

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