A simple, quick and reliable method for TEM cross-section preparation of ceramic oxide films on thin metal substrates

Micron

Volumn 33, Issue 5, 2002, Pages 499-505

  Eyidi, D ^a   Eibl, O ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

Cross section; Dummies; Epitaxy; Metal substrate; Nickel; Oxide films; Preparation; Transmission electron microscopy; YBa2Cu3O 7

Indexed keywords

ARTICLE;

EID: 0036246805     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(02)00018-5     Document Type: Article

References (11)

1. Preparation techniques for transmission electron microscopy
2. Biaxially textured Ni-alloyed tapes as substrates for buffer and YBCO film growth
3. New method for absorption correction in high-accuracy, quantitative EDX microanalysis in the Tem including low-energy X-ray lines
4. c superconductors
5. 10+δ: Features of the structure and microstructure relevant for devices in magnet and energy technology
6. 7 thick films on biaxially textured metals
7. 2 and ion-beam-assisted yttria-stabilized zirconia buffer layers
8. Transmission electron microscope sample preparation using a focused ion beam
9. YBaCuO - Deposition on metal tape substrate
10. Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-sections for high resolution electron microscopy
11. TEM cross-section preparation with minimal ion milling time