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Volumn 60, Issue 2, 2002, Pages 300-308
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Analysis of acid-treated dentin smear debris and smear layers using confocal Raman microspectroscopy
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Author keywords
Dentin; Microspectroscopy; Raman; Smear
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Indexed keywords
ABRASION;
BONDING;
COLLAGEN;
MOLECULAR STRUCTURE;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILICON CARBIDE;
SPECTRUM ANALYSIS;
SUBSTRATES;
SMEAR LAYERS;
BIOLOGICAL MATERIALS;
ACID;
CITRIC ACID;
COLLAGEN;
EDETIC ACID;
MINERAL;
PHOSPHORIC ACID;
REAGENT;
SILICON CARBIDE;
ARTICLE;
CELL STRUCTURE;
CHEMICAL COMPOSITION;
CHEMICAL STRUCTURE;
DENTIN;
HUMAN;
PROTEIN DENATURATION;
RAMAN SPECTROMETRY;
SCANNING ELECTRON MICROSCOPY;
SMEAR;
ACID ETCHING, DENTAL;
CARBON COMPOUNDS, INORGANIC;
DENTIN;
HUMANS;
MICROSCOPY, CONFOCAL;
MICROSCOPY, ELECTRON, SCANNING;
MOLAR;
SILICON COMPOUNDS;
SPECTRUM ANALYSIS, RAMAN;
SURFACE PROPERTIES;
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EID: 0036186188
PISSN: 00219304
EISSN: None
Source Type: Journal
DOI: 10.1002/jbm.10108 Document Type: Article |
Times cited : (82)
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References (43)
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