Nanoleakage at the dentin adhesive interface vs microtensile bond strength.

Operative dentistry

Volumn 24, Issue 3, 1999, Pages 181-188

  Paul, S J ^a   Welter, D A ^a   Ghazi, M ^a   Pashley, D ^a  

^a MEDICAL COLLEGE OF GEORGIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISPHENOL A BIS(2 HYDROXYPROPYL) ETHER DIMETHACRYLATE; DENTIN BONDING AGENT; ION; RESIN; SILICON DIOXIDE; SILVER; SINGLE BOND; Z100 COMPOSITE RESIN; ZIRCONIUM;

ARTICLE; CHEMISTRY; DENTAL ACID ETCHING; DENTAL BONDING; ELECTRON PROBE MICROANALYSIS; HUMAN; MASS SPECTROMETRY; MATERIALS TESTING; METHODOLOGY; SILVER STAINING; TENSILE STRENGTH; TIME; TOOTH DISEASE;

ACID ETCHING, DENTAL; BISPHENOL A-GLYCIDYL METHACRYLATE; COMPOSITE RESINS; DENTAL BONDING; DENTAL LEAKAGE; DENTIN-BONDING AGENTS; ELECTRON PROBE MICROANALYSIS; HUMANS; IONS; MASS SPECTROMETRY; MATERIALS TESTING; SILICON DIOXIDE; SILVER; SILVER STAINING; TENSILE STRENGTH; TIME FACTORS; ZIRCONIUM;

EID: 0033127821     PISSN: 03617734     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)