In-situ, non-destructive identification of chemical elements by means of portable EDXRF spectrometer

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 2, 1999, Pages 2011-2016

  Fiorini, C ^a   Longoni, A ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; CHEMICAL ELEMENTS; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; QUANTUM EFFICIENCY; SILICON SENSORS; X RAY SPECTROSCOPY;

ENERGY DISPERSIVE X RAY FLUORESCENCE SPECTROMETER; SILICON DRIFT DETECTOR; X RAY GENERATOR;

SPECTROMETERS;

EID: 0033307441     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819273     Document Type: Article

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