A new surface characterization technique: RIMAPS (Rotated Image with Maximum Average Power Spectrum)

Journal of Microscopy

Volumn 206, Issue 1, 2002, Pages 72-83

  Fuentes, N O ^a,b   Favret, E A ^b  

^a CENTRO ATÓMICO CONSTITUYENTES   (Argentina)

^b UNIVERSIDAD NACIONAL DE SAN MARTÍN   (Argentina)

Author keywords

Fourier transform; Imaging; Laser; Light intensity curves; Light microscopy; Scanning electron microscopy; Surface characterization

Indexed keywords

OPTICAL MICROSCOPY; POWER SPECTRUM; SPECTRUM ANALYSIS; SURFACE PROPERTIES; SURFACE TOPOGRAPHY; TOPOGRAPHY;

AVERAGE POWER; AVERAGED POWER SPECTRUMS; CHARACTERIZATION TECHNIQUES; LIGHT INTENSITY; LIGHT INTENSITY CURVE; POWER SPECTRUM ANALYSIS; POWER-SPECTRA; ROTATED IMAGES; SURFACE CHARACTERIZATION; TWO-DIMENSIONAL FOURIER TRANSFORMS;

SCANNING ELECTRON MICROSCOPY;

COPPER; ZINC;

ANALYTIC METHOD; ARTICLE; FOURIER TRANSFORMATION; GEOMETRY; IMAGE QUALITY; IMAGING; LASER; LIGHT INTENSITY; MEASUREMENT; MICROSCOPY; POWER SPECTRUM; PRIORITY JOURNAL; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPY; SPECTRUM; TECHNIQUE; TOPOGRAPHY;

EID: 0036097322     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2002.01003.x     Document Type: Article

References (9)

1. What is the potential of the ULOI technique in metallography? Latest advances
2. Determination of crystal orientations in aluminium by means of unidirectional laser oblique illumination (ULOI)
3. Use of a general imaging model to achieve predictive autofocus in the scanning electron microscope
4. Unidirectional laser oblique illumination (ULOI): A comparison with partial dark field illumination (PDFI) in the optical microscopy of metals
5. Optical metallography with a laser beam. Orientation dependence of the dispersed intensity
6. Effect of lateral resolution on topographical images and three-dimensional functional parameters