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Volumn 219, Issue 1, 1998, Pages 114-123

Effect of lateral resolution on topographical images and three-dimensional functional parameters

Author keywords

Roughness; Surface; Tribology

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTALS; FUNCTIONS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MORPHOLOGY; SURFACE ROUGHNESS;

EID: 0032483166     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(98)00235-X     Document Type: Article
Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.