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Volumn 100, Issue , 2002, Pages 88-97
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Lifetime measurements of highly charged ions
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC PHYSICS;
ELECTRON BEAMS;
ELECTRON TRANSITIONS;
GROUND STATE;
PLASMAS;
STORAGE RINGS;
X RAY ANALYSIS;
ELECTRON BEAM ION TRAP (EBIT);
IONS;
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EID: 0036074037
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (29)
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References (96)
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