Minimum measurements at minimum set of test nodes for analog circuit fault diagnosis

Proceedings of the Mediterranean Electrotechnical Conference - MELECON

Volumn 1, Issue , 2002, Pages 510-516

  Abu El Yazeed, M F ^a  

^a CAIRO UNIVERSITY   (Egypt)

Author keywords

Fault classification; Feature selection; Neural networks; Test nodes selection

Indexed keywords

ACTIVE FILTERS; ALGORITHMS; COMPUTER SIMULATION; FAILURE ANALYSIS; FEATURE EXTRACTION; NEURAL NETWORKS; SPECTRUM ANALYSIS; VECTOR QUANTIZATION;

ANALOG CIRCUITS; FAULT CLASSIFICATION; FEATURE SELECTION; TEST NODES SELECTION;

LINEAR NETWORK ANALYSIS;

EID: 0036046375     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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