Fatigue effect in bulk ferroelectrics

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4699, Issue , 2002, Pages 40-50

  Shur, Vladimir Y ^a   Rumyantsev, Evgenii ^a   Nikolaeva, Ekaterina ^a   Shishkin, Eugene ^a   Baturin, Ivan ^a   Shur, Alevtina ^a   Lupascu, Doru C ^b   Randall, Clive ^c   Ozgul, Metin ^c  

^a URAL FEDERAL UNIVERSITY   (Russian Federation)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Domain kinetics; Ferroelectricity; Internal bias field; Pzn pt single crystals; Pzt ceramics

Indexed keywords

COMPUTER SIMULATION; FATIGUE OF MATERIALS; HYSTERESIS; POLARIZATION; SINGLE CRYSTALS; STRAIN; SWITCHING;

STRAIN HYSTERESIS LOOPS;

FERROELECTRIC MATERIALS;

EID: 0036029227     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.475015     Document Type: Article

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