Cross-section preparation for transmission electron microscopy of phases and interfaces in C/BN heterostructures

Micron

Volumn 33, Issue 1, 2002, Pages 105-109

  Reznik, B ^a   Kalhofer S ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

Boron nitride; Carbon; Color; Silicon; TEM sample preparation

Indexed keywords

ARTICLE;

EID: 0036028110     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(00)00063-9     Document Type: Article

References (15)

1. An updated ion polishing system for TEM specimen preparation of materials
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3. Thin foil preparation for electron microscopy
4. CVD in hot wall reactors - The interaction between homogeneous gas-phase and heterogeneous surface reactions
5. Cross-sectional sample preparation by focused ion beam: A review of ion-sample interaction
6. TEM specimen heating during ion beam thinning: Microstructural instability
7. Fabrication of oxidation resistant carbon/boron nitride matrix composites
8. Use of transmitted color to calibrate the thickness of silicon samples
9. Transmitted color and interference fringes for TEM sample preparation of silicon
10. Application of dark-field electron microscopy to carbon study
11. Micro- and nanostructure of the carbon matrix of infiltrated carbon fiber felts
12. Structure, microtexture, and optical properties of anthracene and saccharose-based carbons
13. Optimization of the wire-shadow TEM cross-section preparation technique
14. Specimen preparation for transmission electron microscopy: Reliable method for cross-sections and brittle materials