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Volumn 12, Issue 3, 2002, Pages 333-363
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On the relaxation limits of the hydrodynamic model for semiconductor devices
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Author keywords
Compensated compactness; Global weak solution; Godunov scheme; Relaxation limit; Semiconductor hydrodynamic model; Trace of weak solution
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Indexed keywords
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EID: 0036013705
PISSN: 02182025
EISSN: None
Source Type: Journal
DOI: 10.1142/S0218202502001684 Document Type: Article |
Times cited : (15)
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References (39)
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