Low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer-scale objects: Application to carbon nanotubes

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 3, 2002, Pages 1044-1047

  Dorozhkin, Pavel ^a   Nejoh, H ^a   Fujita, D ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; ELECTRODES; ELECTRON EMISSION; ELECTRON MICROSCOPES; ELECTRON TRANSPORT PROPERTIES; IMAGE ANALYSIS; SUBSTRATES; VACUUM;

ELECTRON POINT SOURCE MICROSCOPES;

CARBON NANOTUBES;

EID: 0035998551     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1481756     Document Type: Article

References (18)