Growth and evolution of ZnCdSe quantum dots

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 3, 2002, Pages 1102-1106

  Shan, C X ^a   Fan, X W ^a   Zhang, J Y ^a   Zhang, Z Z ^a   Li, B S ^a   Lu, Y M ^a   Liu, Y C ^a   Shen, D Z ^a   Kong, X G ^a   Wang, X H ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOLUMINESCENCE; RELAXATION PROCESSES; SEMICONDUCTOR GROWTH; SPECTRUM ANALYSIS; STRAIN; THICKNESS MEASUREMENT; ZINC COMPOUNDS;

STRAIN RELAXATION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0035998537     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1481870     Document Type: Conference Paper

References (21)