X-ray reflectivity studies of highly crystalline CeO 2 films on (1 1 0 2) Al 2 O 3

Applied Surface Science

Volumn 174, Issue 3-4, 2001, Pages 257-260

  Bang, S H ^a   Cho, J H ^a   Kim, H K ^a   Cho, H J ^a  

^a Pusan National University   (South Korea)

Author keywords

Dielectric thin films; Interface structure and roughness; X ray reflectivity

Indexed keywords

CARRIER CONCENTRATION; CERIUM COMPOUNDS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FILM GROWTH; SAPPHIRE; X RAY DIFFRACTION ANALYSIS;

X RAY REFLECTIVITY;

SEMICONDUCTING FILMS;

EID: 0035971614     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00174-X     Document Type: Article

References (12)