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Volumn 56, Issue 6, 2001, Pages 1011-1025
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An evaluation of a commercial Échelle spectrometer with intensified charge-coupled device detector for materials analysis by laser-induced plasma spectroscopy
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Author keywords
Aluminum alloy; chelle spectrometer; Intensified charge coupled device (ICCD) detection; Laser induced plasma spectroscopy; Plasma characterization
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Indexed keywords
ALUMINUM ALLOYS;
CARRIER CONCENTRATION;
CHARGE COUPLED DEVICES;
LASER BEAM EFFECTS;
LASER PRODUCED PLASMAS;
PLASMA DIAGNOSTICS;
SPECTROMETERS;
CHARGE-COUPLED DEVICE DETECTOR;
ECHELLE SPECTROMETER;
EMISSION SPECTROSCOPY;
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EID: 0035967725
PISSN: 05848547
EISSN: None
Source Type: Journal
DOI: 10.1016/S0584-8547(01)00174-4 Document Type: Article |
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Times cited : (100)
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References (23)
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