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Volumn 57, Issue 2, 1998, Pages 225-227

Measured stark widths and shifts of neutral silicon spectral lines

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[No Author keywords available]

Indexed keywords


EID: 0000624040     PISSN: 00318949     EISSN: None     Source Type: Journal    
DOI: 10.1088/0031-8949/57/2/012     Document Type: Article
Times cited : (9)

References (9)
  • 3
    • 85034197787 scopus 로고
    • (July 1978 through March 1992) NIST Special Publication 336, DC National Institute of Standards and Technology, Washington
    • Fuhr, J. R. and Lesage, A., "Bibliography on Atomic Line Shapes and Shifts" (July 1978 through March 1992) NIST Special Publication 336, Suppplement 4, (DC National Institute of Standards and Technology, Washington, 1993).
    • (1993) Bibliography on Atomic Line Shapes and Shifts , Issue.4 SUPPPL.
    • Fuhr, J.R.1    Lesage, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.