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Volumn 53, Issue 13, 1998, Pages 1815-1825

Laser induced breakdown spectrometry with an echelle spectrometer and intensified charge coupled device detection

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; LASER ABLATION; MICROANALYSIS; PLASMAS; SPECTRUM ANALYSIS;

EID: 0032208321     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(98)00234-1     Document Type: Article
Times cited : (83)

References (17)
  • 1
    • 85120142772 scopus 로고    scopus 로고
    • L.J. Radziemski, D.A. Cremers, Laser Induced Plasmas, Marcel Dekker, New York, 1989.
  • 2
    • 85120143490 scopus 로고    scopus 로고
    • E.H. Piepmeier, in: Analytical Applications of Lasers, Wiley, New York, 1986, p. 627.
  • 10
    • 85120114092 scopus 로고    scopus 로고
    • H. Becker-Roß, S. Florek, Spectrochim. Acta Part B., in preparation.
  • 12
    • 85120100087 scopus 로고    scopus 로고
    • J. Reader, C.H. Corliss, NIST Standard Reference Data Base 38, Database Software developed by W.G. Mallard, G.R. Dalton, J.W. Gallagher, Gaithersburg, MD, USA, 1992.
  • 15
    • 85120105003 scopus 로고    scopus 로고
    • W.L. Wiese, G.A. Martin, in: Wavelengths and Transitions Probabilities for Atoms and Atomic Ions, Part II, NSRDS-NBS 68, US Government Printing Office, Washington, DC, 1980.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.