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Volumn 13, Issue 2, 1998, Pages 388-395

The dependence of structural and mechanical properties on film thickness in sol-gel zirconia films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; HARDNESS; INTERFACES (MATERIALS); MECHANICAL PROPERTIES; MORPHOLOGY; SOL-GELS; STRUCTURE (COMPOSITION); SUBSTRATES; THERMODYNAMIC PROPERTIES; X RAY DIFFRACTION; ZIRCONIA;

EID: 0032001237     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0051     Document Type: Article
Times cited : (46)

References (13)
  • 13
    • 0027843687 scopus 로고
    • Thin Films: Stresses and Mechanical Properties IV, edited by P.H. Townsend, T.P. Weihs, J.E. Sanchez, Jr., and P. Børgesen Pittsburgh, PA
    • M.V. Swain and E.R. Weppelmann, in Thin Films: Stresses and Mechanical Properties IV, edited by P.H. Townsend, T.P. Weihs, J.E. Sanchez, Jr., and P. Børgesen (Mater. Res. Soc. Symp. Proc. 308, Pittsburgh, PA, 1993), p. 177.
    • (1993) Mater. Res. Soc. Symp. Proc. , vol.308 , pp. 177
    • Swain, M.V.1    Weppelmann, E.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.