|
Volumn 13, Issue 2, 1998, Pages 388-395
|
The dependence of structural and mechanical properties on film thickness in sol-gel zirconia films
a b c |
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
HARDNESS;
INTERFACES (MATERIALS);
MECHANICAL PROPERTIES;
MORPHOLOGY;
SOL-GELS;
STRUCTURE (COMPOSITION);
SUBSTRATES;
THERMODYNAMIC PROPERTIES;
X RAY DIFFRACTION;
ZIRCONIA;
FILM SUBSTRATE INTERFACE;
FILM THICKNESS;
ULTRAMICRO INDENTATION MEASUREMENT;
ZIRCONIA FILM;
THICK FILMS;
|
EID: 0032001237
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.1998.0051 Document Type: Article |
Times cited : (46)
|
References (13)
|