Impact of domain wall displacements on the dielectric permittivity of epitaxial Ba0.5Sr0.5TiO3 films

Applied Physics Letters

Volumn 79, Issue 13, 2001, Pages 2052-2054

  Boikov, Yu A ^a,b   Claeson, T ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035943838     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1405147     Document Type: Article

References (15)

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