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Applied Surface Science

Volumn 182, Issue 3-4, 2001, Pages 244-250

Scanning probe microscopy and X-ray studies of confined metal films

(4) Hazra, S a Pal, S a Kundu, S a Sanyal, M K a

a SAHA INSTITUTE OF NUCLEAR PHYSICS (India)

Author keywords

Scanning probe microscopy; Thin metal films; X ray scattering

Indexed keywords

FILM GROWTH; MORPHOLOGY; MULTILAYERS; SCANNING TUNNELING MICROSCOPY; SPUTTER DEPOSITION; THIN FILMS; X RAY SCATTERING;

CONFINEMENT EFFECTS; FILM THICKNESS; SCANNING PROBE MICROSCOPY;

METALLIC FILMS;

EID: 0035935511 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(01)00440-8 Document Type: Article

Times cited : (8)

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